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The British Journal of Radiology, Vol 69, Issue 823 636-649, Copyright © 1996 by British Institute of Radiology
ARTICLES |
CT Chantler, RD Deslattes, A Henins and LT Hudson
School of Physics, University of Melbourne, Parkville, Victoria, Australia.
The demand for improved spectral understanding of mammographic X-ray sources and non-invasive voltage calibration of such sources has led to research into applications using curved crystal spectroscopy. Recent developments and the promise of improved precision and control are described. Analytical equations are presented to indicate effects of errors and alignment problems in the flat and curved crystal systems. These are appropriate for all detection systems. Application to and testing of spectrographic detection (using standard X-ray film) is presented. Suitable arrangements exist which can be used to measure X-ray tube voltages well below 1 kV precision in the operating range of 20-35 kV.
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